An often Missed Detail: Formula Relating Peek Sensitivity with Gain Margin Less Than One
M. Šebek, Z. Hurák
Czech Technical University in Prague
Abstract
An inequality relating gain margin with sensitivity peek value is presented in numerous basic control textbooks. In fact, this inequality fails to hold as soon as the open loop Nyquist plot crosses the negative real axis on the left from the critical point. This opposite case is usually ignored by the textbook authors. A simple alternative inequality is derived in the paper to cover the not so popular opposite case. This fills a small gap one often encounters in basic control courses.
Full paper
Session
Linear and Non-linear Control System Design (Lecture)
Reference
Šebek, M., Hurák, Z.: An often Missed Detail: Formula Relating Peek Sensitivity with Gain Margin Less Than One. Editors: Fikar, M., Kvasnica, M., In Proceedings of the 17th International Conference on Process Control ’09, Štrbské Pleso, Slovakia, 65–72, 2009
BibTeX
| @inProceedings{pc09-115, | ||
| author | = { | Šebek, M. and Hurák, Z.}, |
| title | = { | An often Missed Detail: Formula Relating Peek Sensitivity with Gain Margin Less Than One}, |
| booktitle | = { | Proceedings of the 17th International Conference on Process Control '09}, |
| year | = { | 2009}, |
| pages | = { | 65-72}, |
| editor | = { | Fikar, M. and Kvasnica, M.}, |
| address | = { | Štrbské Pleso, Slovakia}, |
| publisher | = { | Slovak University of Technology in Bratislava}, |
| url | = { | http://www.kirp.chtf.stuba.sk/pc09/data/papers/115.pdf}} |