Compact Identification of Process Static Gain and One Point of Frequency Response
J. Mertl, M. Schlegel
University of West Bohemia in Pilsen
Abstract
The aim of this paper is to present a new process identification method suitable for automatic tuning of PID controllers. The method combines two experiments together. The first experiment is a process static gain identification and the second is a relay experiment which identifies one point of the process frequency response. Moreover a constant-phase filter is used in the relay feedback loop to get a frequency response sample with phase shift different from -180 degrees. The constant-phase filter parameters are tuned during the first experiment part.
Full paper
Session
Modelling, Simulation, and Identification of Processes (Poster)
Reference
Mertl, J., Schlegel, M.: Compact Identification of Process Static Gain and One Point of Frequency Response. Editors: Fikar, M., Kvasnica, M., In Proceedings of the 17th International Conference on Process Control ’09, Štrbské Pleso, Slovakia, 187–193, 2009
BibTeX
| @inProceedings{pc09-049, | ||
| author | = { | Mertl, J. and Schlegel, M.}, |
| title | = { | Compact Identification of Process Static Gain and One Point of Frequency Response}, |
| booktitle | = { | Proceedings of the 17th International Conference on Process Control '09}, |
| year | = { | 2009}, |
| pages | = { | 187-193}, |
| editor | = { | Fikar, M. and Kvasnica, M.}, |
| address | = { | Štrbské Pleso, Slovakia}, |
| publisher | = { | Slovak University of Technology in Bratislava}, |
| url | = { | http://www.kirp.chtf.stuba.sk/pc09/data/papers/049.pdf}} |